Characterization of ion exchanged integrated lightwave devices with an apertureless scanning near-field optical microscope
نویسندگان
چکیده
Sébastien Aubert*, Elise Ghibaudo, Aurélien Bruyant*, Sylvain Blaize*, Renaud Bachelot*, Gilles Lerondel*, Pascal Royer*, Jean-Emmanuel Broquin [email protected] Laboratoire de Nanotechnologie et d’Instrumentation Optique, Université de Technologie de Troyes, 12 rue Marie Curie, BP2060, 10010 Troyes cedex, France Institut de Microélectronique, Electromagnétisme et Photonique, LEMO-ENSERG, UMR 5530, INPG-UJF, 23 rue des Martyrs, BP257, 38013 Grenoble, France
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